Zener diodes with 5.1V output for power use
Manufacturer： microsemi
The 1PMT5918B Series is a robust line of transient voltage suppressor (TVS) diodes, meticulously engineered to protect sensitive electronic components from voltage spikes and transients. Designed for use in a wide range of applications, this series offers exceptional clamping performance and low breakdown voltage, making it an ideal choice for safeguarding circuits in various environments. The 1PMT5918B diodes feature a unidirectional configuration and are constructed using high-quality semiconductor materials that ensure rapid response times and reliability under extreme conditions.
One of the key features of the 1PMT5918B Series is its impressive peak pulse power rating, capable of withstanding surges of up to 600 watts. This makes it particularly valuable in applications subject to sudden overvoltage conditions. Additionally, the series boasts a low reverse leakage current, which minimizes power loss during normal operation, ensuring efficient performance in power-sensitive applications. The diodes are housed in a compact DO-214AA (SMB) package, facilitating easy integration into both through-hole and surface-mount designs.
The design characteristics of the 1PMT5918B Series are tailored for versatility and reliability. With breakdown voltages ranging from 5.0V to 18V, these TVS diodes can effectively protect various components, including microcontrollers, communication devices, and automotive electronics. The series is particularly suitable for applications in telecommunications, consumer electronics, industrial automation, and automotive systems, where transient voltage protection is paramount.
In summary, the 1PMT5918B Series stands out as a dependable solution for transient voltage suppression, combining high power handling capability, low leakage, and compact design. Whether employed in mobile devices, industrial machinery, or automotive circuits, these TVS diodes provide essential protection against voltage transients, ensuring the longevity and reliability of electronic systems across diverse applications.